Bias Temperature Instability for Devices and Circuits by Tibor Grasser PDF

By Tibor Grasser

This e-book presents a single-source connection with one of many more difficult reliability matters plaguing smooth semiconductor applied sciences, damaging bias temperature instability. Readers will reap the benefits of state-of-the artwork assurance of study in themes reminiscent of time established illness spectroscopy, anomalous illness habit, stochastic modeling with extra metastable states, multiphonon concept, compact modeling with RC ladders and implications on equipment reliability and lifetime.

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Bias Temperature Instability for Devices and Circuits by Tibor Grasser


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